ELECTRON-DIFFRACTION PHENOMENA OBSERVED WITH A HIGH-RESOLUTION STEM INSTRUMENT

被引：69

作者：

COWLEY, JM

机构：

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1986年 / 3卷 / 01期

关键词：

D O I：

10.1002/jemt.1060030105

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：25 / 44

页数：20

共 46 条

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