ELECTRON-DIFFRACTION PHENOMENA OBSERVED WITH A HIGH-RESOLUTION STEM INSTRUMENT

被引:69
作者
COWLEY, JM
机构
来源
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1986年 / 3卷 / 01期
关键词
D O I
10.1002/jemt.1060030105
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
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页码:25 / 44
页数:20
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