APPLICATIONS OF MODERN MICRODIFFRACTION TO MATERIALS SCIENCE

[1] FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (02): : 325 - 335

[2] BARNETT ME, 1974, J MICROSC-OXFORD, V102, P1, DOI 10.1111/j.1365-2818.1974.tb03962.x

[3] BENTLEY J, 1980, 38TH P ANN M EL MICR, P72

[4] Boersch H, 1936, ANN PHYS-BERLIN, V27, P75

[5] BROWN LM, 1976, SCANNING ELECTRON MI, V1, P353

[6] 3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN): : 55 - &

[7] CARPENTER RW, 1980, 15TH P ANN C MICR AN, V1

[8] CARPENTER RW, 1982, 40TH P ANN M EMSA, P696

[9] CHAN IYT, 1981, P VAIL WORKSHOP, P107

[10] CONDENSER APERTURE MISALIGNMENT AND SOLUTE PROFILE ASYMMETRIES IN STEM X-RAY-MICROANALYSIS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1983, 130 (MAY): : RP3 - RP4

[1] FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (02): : 325 - 335

[2] BARNETT ME, 1974, J MICROSC-OXFORD, V102, P1, DOI 10.1111/j.1365-2818.1974.tb03962.x

[3] BENTLEY J, 1980, 38TH P ANN M EL MICR, P72

[4] Boersch H, 1936, ANN PHYS-BERLIN, V27, P75

[5] BROWN LM, 1976, SCANNING ELECTRON MI, V1, P353

[6] 3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN): : 55 - &

[7] CARPENTER RW, 1980, 15TH P ANN C MICR AN, V1

[8] CARPENTER RW, 1982, 40TH P ANN M EMSA, P696

[9] CHAN IYT, 1981, P VAIL WORKSHOP, P107

[10] CONDENSER APERTURE MISALIGNMENT AND SOLUTE PROFILE ASYMMETRIES IN STEM X-RAY-MICROANALYSIS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1983, 130 (MAY): : RP3 - RP4