SCANNING TUNNELING MICROSCOPY AT POTENTIAL CONTROLLED ELECTRODE SURFACES IN ELECTROLYTIC ENVIRONMENT

被引：125

作者：

LUSTENBERGER, P

ROHRER, H

CHRISTOPH, R

SIEGENTHALER, H

机构：

[1] IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

[2] UNIV BERN,INST ANORGAN ANALYT & PHYS CHEM,CH-3012 BERN,SWITZERLAND

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1988年 / 243卷 / 01期

关键词：

D O I：

10.1016/0022-0728(88)85043-5

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：225 / 235

页数：11

共 20 条

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[2] DETERMINATION OF SURFACE-TOPOGRAPHY OF BIOLOGICAL SPECIMENS AT HIGH-RESOLUTION BY SCANNING TUNNELLING MICROSCOPY
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[7] THE GROWTH AND PROPERTIES OF THIN OXIDE LAYERS ON TANTALUM ELECTRODES
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[J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1984, 180 (1-2): : 157 - 170
[8] SCANNING TUNNELING MICROSCOPY OF METAL-SURFACES IN AIR
MORITA, S
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[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 119 - 125
[9] TUNNELING MICROSCOPY OF GRAPHITE IN AIR
PARK, SI
QUATE, CF
[J]. APPLIED PHYSICS LETTERS, 1986, 48 (02) : 112 - 114
[10] REMNERS G, 1987, P ADRIATICO RES C ST

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