SCANNING TUNNELING MICROSCOPY OF METAL-SURFACES IN AIR

被引：10

作者：

MORITA, S ^{[1
]}

OKADA, T ^{[1
]}

ISHIGAME, Y ^{[1
]}

MIKOSHIBA, N ^{[1
]}

机构：

[1] OLYMPUS OPT CO LTD,ISHIKAWA CHO 2951,HACHIOJI 192,JAPAN

来源：

SURFACE SCIENCE | 1987年 / 181卷 / 1-2期

关键词：

D O I：

10.1016/0039-6028(87)90148-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：119 / 125

页数：7

共 10 条

[1] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE
BINNIG, G
ROHRER, H
GERBER, C
WEIBEL, E
[J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123
[2] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE
BRYANT, A
SMITH, DPE
QUATE, CF
[J]. APPLIED PHYSICS LETTERS, 1986, 48 (13) : 832 - 834
[3] ANODIC OXIDE FILMS ON ALUMINUM
DIGGLE, JW
DOWNIE, TC
GOULDING, CW
[J]. CHEMICAL REVIEWS, 1969, 69 (03) : 365 - &
[4] CONDUCTIVITY AND STRUCTURE OF THIN OXIDE LAYERS GROWN ON A METAL-SUBSTRATE - SCANNING-TUNNELING MICROSCOPY IN NIO ON NI(100)
GARCIA, R
SAENZ, JJ
GARCIA, N
[J]. PHYSICAL REVIEW B, 1986, 33 (06): : 4439 - 4442
[5] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE
GERBER, C
BINNIG, G
FUCHS, H
MARTI, O
ROHRER, H
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) : 221 - 224
[6] PROPERTIES OF POROUS ANODIC ALUMINUM-OXIDE FILMS AS MEMBRANES
ITAYA, K
SUGAWARA, S
ARAI, K
SAITO, S
[J]. JOURNAL OF CHEMICAL ENGINEERING OF JAPAN, 1984, 17 (05) : 514 - 520
[7] IMAGES OF BARRIER LAYER OF ANODIC ALUMINUM-OXIDE IN AIR OBTAINED WITH SCANNING TUNNELING MICROSCOPE
MORITA, S
ITAYA, K
MIKOSHIBA, N
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (09): : L743 - L745
[8] VOLTAGE-DEPENDENCE OF SCANNING TUNNELING MICROSCOPY ON TITANIUM SURFACE IN AIR
MORITA, S
OKADA, T
ISHIGAME, Y
SATO, C
MIKOSHIBA, N
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (06): : L516 - L518
[9] ATOMIC-RESOLUTION MICROSCOPY IN WATER
SONNENFELD, R
HANSMA, PK
[J]. SCIENCE, 1986, 232 (4747) : 211 - 213
[10] HIGH-STABILITY SCANNING TUNNELING MICROSCOPE
VANDEWALLE, GFA
GERRITSEN, JW
VANKEMPEN, H
WYDER, P
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (08) : 1573 - 1576

← 1 →