MEASUREMENT OF 3-DIMENSIONAL DISPLACEMENTS BY SCANNING A DOUBLE-EXPOSURE HOLOGRAM

被引：15

作者：

BELLANI, VF ^{[1
]}

SONA, A ^{[1
]}

机构：

[1] CTR INFORMAZIONE STUDIO ESPERIENZE,20100 MILAN,ITALY

来源：

APPLIED OPTICS | 1974年 / 13卷 / 06期

关键词：

D O I：

10.1364/AO.13.001337

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1337 / 1341

页数：5

共 20 条

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[4] Boone P. M., 1972, Optics and Laser Technology, V4, P162, DOI 10.1016/0030-3992(72)90003-5
[5] Collier R.J., 1971, OPTICAL HOLOGRAPHY, V1st ed.
[6] MEASUREMENT OF IN-PLANE SURFACE STRAIN BY HOLOGRAM INTERFEROMETRY
ENNOS, AE
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (07): : 731 - &
[7] Fink W., 1970, Optics Technology, V2, P146, DOI 10.1016/0374-3926(70)90039-6
[8] Gates J. W. C., 1969, Optics Technology, V1, P247, DOI 10.1016/S0374-3926(69)80067-0
[9] MEASURING ACCURACY OF 3-DIMENSIONAL DISPLACEMENTS IN HOLOGRAPHIC INTERFEROMETRY
MATSUMOT.T
IWATA, K
NAGATA, R
[J]. APPLIED OPTICS, 1973, 12 (05): : 961 - 967
[10] QUANTITATIVE DEFORMATION MEASUREMENTS OF DIFFUSELY REFLECTING OBJECTS WITH AID OF HOLOGRAPHY
MICHAEL, H
[J]. APPLIED OPTICS, 1973, 12 (06): : 1111 - 1113