MEASUREMENT OF 3-DIMENSIONAL DISPLACEMENTS BY SCANNING A DOUBLE-EXPOSURE HOLOGRAM

被引：15

作者：

BELLANI, VF ^{[1
]}

SONA, A ^{[1
]}

机构：

[1] CTR INFORMAZIONE STUDIO ESPERIENZE,20100 MILAN,ITALY

来源：

APPLIED OPTICS | 1974年 / 13卷 / 06期

关键词：

D O I：

10.1364/AO.13.001337

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1337 / 1341

页数：5

共 20 条

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[13] MEASUREMENT OF 3 DIMENSIONAL DISPLACEMENTS BY HOLOGRAM INTERFEROMETRY
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UCHIYAMA, H
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[15] COMMENT ON - HOLOGRAPHIC INTERFEROMETRY APPLIED TO MEASUREMENTS OF SMALL STATIC DISPLACEMENTS OF DIFFUSELY REFLECTING SURFACES
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[20] INPLANE DISPLACEMENT OF A STRESSED MEMBRANE WITH A HOLE MEASURED BY HOLOGRAPHIC INTERFEROMETRY
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