MEASUREMENT OF THE MISCUT ANGLE OF CRYSTAL-SURFACES VICINAL TO MAJOR CRYSTAL PLANES BY X-RAY-DIFFRACTOMETRY AT GLANCING INCIDENCE

被引：4

作者：

SLUSKY, SEG

MACRANDER, AT

机构：

来源：

APPLIED PHYSICS LETTERS | 1988年 / 53卷 / 21期

关键词：

D O I：

10.1063/1.100313

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2042 / 2043

页数：2

共 12 条

[1]

BARTELS WJ, 1983, J VAC SCI TECHNOL B, V1, P328

[2]

Bond W.L., 1976, CRYSTAL TECHNOLOGY

[3]

James R. W., 1982, OPTICAL PRINCIPLES D

[4] X-RAY DOUBLE-CRYSTAL CHARACTERIZATION OF HIGHLY PERFECT INGAAS INP GROWN BY VAPOR-PHASE EPITAXY [J].

MACRANDER, AT ;

STREGE, KE .

JOURNAL OF APPLIED PHYSICS, 1986, 59 (02) :442-446

[5]

PIESBERGEN U, 1963, Z NATURFORSCH PT A, VA 18, P141

[6] LATTICE-PARAMETER-DIFFERENCE MEASUREMENT OF HETEROEPITAXIAL STRUCTURES BY MEANS OF EXTREMELY ASYMMETRICAL BRAGG-DIFFRACTION [J].

PIETSCH, U ;

BORCHARD, W .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1987, 20 (01) :8-10

[7] X-RAY DETERMINATION OF STRESSES IN THIN-FILMS AND SUBSTRATES BY AUTOMATIC BRAGG ANGLE CONTROL [J].

ROZGONYI, GA ;

CIESIELK.TJ .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (08) :1053-1057

[8] X-RAY-DIFFRACTION WITH A 4-REFLECTION MONOCHROMATOR [J].

SLUSKY, SEG ;

MACRANDER, AT .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1987, 20 (06) :522-528

[9] DOUBLE AXIS X-RAY-DIFFRACTOMETRY AT GLANCING ANGLES [J].

TANNER, BK ;

HILL, MJ .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1986, 19 (12) :L229-L235

[10]

Zachariasen W. H., 1967, THEORY XRAY DIFFRACT

← 1 2 →