共 6 条
Error Rate Measurements of a Josephson Single Flux Quantum Binary Ripple Counter
被引:9
作者:
Durand, Dale J.
[1
]
Sandell, Rob D.
[1
]
Heflinger, Lee
[1
]
Silver, Arnold H.
[1
]
机构:
[1] TRW Space & Technol Grp, Redondo Beach, CA 90278 USA
关键词:
D O I:
10.1109/77.139227
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Single flux quantum devices are used in superconductive analog-to-digital converters (ADC's), shift registers, and memory cells. They have been proposed for logic applications. We report the performance of high-speed superconducting, single-flux quantum (SFQ) ripple counters. Both memory and logic functions of the counter are investigated. Errors in logic operation produce bit error rates (BER's) as low as 0.22 errors per million binary operations, measured while counting 100-MHz pseudorandom input pulses. Errors in memory function do not occur on the time scale of the measurements. The BER is shown to be nearly independent of input bit rate and pattern, but strongly dependent on the counter cell operating point.
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页码:106 / 110
页数:5
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