THE DEPTH PROFILING OF GLASS SURFACES BY MASS-SPECTROMETRY USING NEUTRAL-PARTICLE BOMBARDMENT

被引：6

作者：

IINO, A ^{[1
]}

MIZUIKE, A ^{[1
]}

机构：

[1] NAGOYA UNIV, FAC ENGN, CHIKUSA KU, NAGOYA, AICHI 464, JAPAN

来源：

BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN | 1981年 / 54卷 / 07期

关键词：

D O I：

10.1246/bcsj.54.1975

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：1975 / 1977

页数：3

共 9 条

[1]

Bach H., 1976, Radiation Effects, V28, P215, DOI 10.1080/00337577608237442

[2] STUDY OF COMPOSITION OF LEACHED GLASS SURFACES BY PHOTOELECTRON-SPECTROSCOPY [J].

ESCARD, JH ;

BRION, DJ .

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[3] SIMS ANALYSIS OF AQUEOUS CORROSION PROFILES IN SODA-LIME-SILICA GLASS [J].

GOSSINK, RG ;

GREFTE, HAMD ;

WERNER, HW .

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[4] INTERDIFFUSION OF POTASSIUM AND SODIUM IONS IN PYREX GLASS [J].

IINO, A ;

NAKAMURA, H ;

MIZUIKE, A .

NIPPON KAGAKU KAISHI, 1977, (09) :1324-1327

[5]

KOBAYASHI H, 1977, SHITSURYO BUNSEKI, V25, P315

[6]

MCCAUGHAN DV, 1974, CHARACTERIZATION SOL, pCH22

[7] SECONDARY ION MASS-SPECTROMETRY FOR DIFFUSION STUDIES IN GLASS [J].

MIZUIKE, A ;

IINO, A .

BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN, 1977, 50 (06) :1469-1471

[8] AES COMPOSITIONAL PROFILES OF MOBILE IONS IN SURFACE REGION OF GLASS [J].

PANTANO, CG ;

DOVE, DB ;

ONODA, GY .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01) :414-418

[9]

SCHERRER S, 1977, 11TH P INT GLASS PRA, V3, P301

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