AES COMPOSITIONAL PROFILES OF MOBILE IONS IN SURFACE REGION OF GLASS

被引：57

作者：

PANTANO, CG ^{[1
]}

DOVE, DB ^{[1
]}

ONODA, GY ^{[1
]}

机构：

[1] UNIV FLORIDA,GAINESVILLE,FL 32611

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1976年 / 13卷 / 01期

关键词：

D O I：

10.1116/1.568934

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：414 / 418

页数：5

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[3]

LEYS J, 1975, 77TH AM CER SOC M WA

[4] OXYGEN OUTGASSING CAUSED BY ELECTRON BOMBARDMENT OF GLASS [J].

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[5]

MCCAUGHAN DV, 1974, CHARACTERIZATION SOL, P627

[6]

ONODA GY, 1974, MATERIALS SCIENCE RE, V7, P39

PANTANO, CG ;

DOVE, DB ;

ONODA, GY .

[8]

PANTANO CG, IN PRESS

[9]

RYND JP, 1975, SURF SCI, V48

[10] ELECTRON-PROBE MICROANALYSIS OF ALKALI METALS IN GLASSES [J].

VASSAMILLET, LF ;

CALDWELL, VE .