AES ANALYSIS OF SODIUM IN A CORRODED BIOGLASS USING A LOW-TEMPERATURE TECHNIQUE

被引：28

作者：

PANTANO, CG ^{[1
]}

DOVE, DB ^{[1
]}

ONODA, GY ^{[1
]}

机构：

[1] UNIV FLORIDA,DEPT MAT SCI & ENGN,GAINESVILLE,FL 32611

来源：

APPLIED PHYSICS LETTERS | 1975年 / 26卷 / 11期

关键词：

D O I：

10.1063/1.88017

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：601 / 602

页数：2

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共 8 条

[1] AUGER AND ELLIPSOMETRIC STUDY OF PHOSPHORUS SEGREGATION IN OXIDIZED DEGENERATE SILICON
CHOU, NJ
VANDERME.YJ
HAMMER, R
CAHILL, J
[J]. APPLIED PHYSICS LETTERS, 1974, 24 (04) : 200 - 202
[2] AUGER ANALYSIS OF CHLORINE IN HCL-GROWN, OR CL2-GROWN SIO2 FILMS
CHOU, NJ
OSBURN, CM
VANDERME.YJ
HAMMER, R
[J]. APPLIED PHYSICS LETTERS, 1973, 22 (08) : 380 - 381
[3] CLARK AE, 1975, THESIS U FLORIDA
[4] CLARK AR, UNPUBLISHED
[5] HENCH LL, 1974, J BIOMED MATER RES 1, P49
[6] ION NEUTRALIZATION PROCESSES AT INSULATOR SURFACES AND CONSEQUENT IMPURITY MIGRATION EFFECTS IN SIO2 FILMS
MCCAUGHAN, DV
KUSHNER, RA
MURPHY, VT
[J]. PHYSICAL REVIEW LETTERS, 1973, 30 (13) : 614 - 617
[7] ONODA GY, 1974, MATERIALS SCIENCE RE, V7, P39
[8] ELECTRON-PROBE MICROANALYSIS OF ALKALI METALS IN GLASSES
VASSAMILLET, LF
CALDWELL, VE
[J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1637 - +