A NEW TECHNIQUE FOR THE OBSERVATION OF X-RAY CTR SCATTERING BY USING AN IMAGING PLATE DETECTOR

被引：46

作者：

SHIMURA, T

HARADA, J

机构：

[1] Nagoya Univ, Nagoya

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1993年 / 26卷

关键词：

D O I：

10.1107/S0021889892010239

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A new technique, using an Imaging Plate (IP) detector, was developed for the observation of X-ray crystal truncation rod (CTR) scattering. The use of an IP detector in conjunction with a synchrotron-radiation (SR) source is very effective for the observation of CTR scattering. The advantages and disadvantages of this technique are indicated by examples of the observation of CTR scattering from various samples: a naturally oxidized surface of an Si(111) wafer, MBE-grown GaAs/AlAs/GaAs on GaAs(001) substrate; Al-capped GaAs on an Si(111) substrate; and a cleavage NaCl(001) surface. It is also shown that it is possible to convert the observed intensity of the CTR scattering to an absolute scale if a stationary photograph is taken.

引用

页码：151 / 158

页数：8

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