COMBINED APERTURE SNOM/PSTM - BEST OF BOTH WORLDS

被引：47

作者：

HECHT, B ^{[1
]}

HEINZELMANN, H ^{[1
]}

POHL, DW ^{[1
]}

机构：

[1] UNIV BASEL,INST PHYS,CH-4056 BASEL,SWITZERLAND

来源：

ULTRAMICROSCOPY | 1995年 / 57卷 / 2-3期

关键词：

D O I：

10.1016/0304-3991(94)00144-C

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Aperture scanning near-field optical microscopy (SNOM/NSOM) and scanning tunneling optical microscopy (STOM, also known as PSTM) are integrated into an instrument which combines the advantages of both schemes. As a result, more near-field optical information can be obtained and new modes of operation become possible. Scan images of a glass surface with a fine grating relief demonstrate some of the capabilities of the new 'TNOM' technique.

引用

页码：228 / 234

页数：7

共 13 条

[1] NEAR-FIELD OPTICS - MICROSCOPY, SPECTROSCOPY, AND SURFACE MODIFICATION BEYOND THE DIFFRACTION LIMIT [J].