COLLECTION MODE NEAR-FIELD SCANNING OPTICAL MICROSCOPY

被引：274

作者：

BETZIG, E

ISAACSON, M

LEWIS, A

机构：

来源：

APPLIED PHYSICS LETTERS | 1987年 / 51卷 / 25期

关键词：

D O I：

10.1063/1.98956

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：2088 / 2090

页数：3

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[7] SUBMICROMETER APERTURE IN A THIN METAL-FILM AS A PROBE OF ITS MICROENVIRONMENT THROUGH ENHANCED LIGHT-SCATTERING AND FLUORESCENCE
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