OBSERVATIONS OF REPEATED CURIE-POINT WRITING EFFECTS ON MNBI FILMS

被引：6

作者：

AAGARD, RL ^{[1
]}

SCHMIT, FM ^{[1
]}

LIU, TS ^{[1
]}

CHEN, D ^{[1
]}

机构：

[1] HONEYWELL CORP,RES CTR,BLOOMINGTON,MN 55420

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1973年 / MAG9卷 / 03期

关键词：

D O I：

10.1109/TMAG.1973.1067691

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：463 / 466

页数：4

共 10 条

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AAGARD, RL ;

CHEN, D ;

LEE, TC .

APPLIED OPTICS, 1972, 11 (10) :2133-&

[2]

AAGARD RL, 1968, IEEE T MAGNETICS, VMAG4, P412

[3]

AAGARD RL, 1971, IEEE T MAGNETICS, VMAG7, P380

[4]

BERNAL E, 1971, J APPL PHYS, V42, P6

[5]

BERNAL E, 1971, AIP C P, P737

[6] MNBI FILMS - HIGH-TEMPERATURE PHASE PROPERTIES AND CURIE-POINT WRITING CHARACTERISTICS [J].

CHEN, D ;

AAGARD, RL .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (06) :2530-+

[7] MAGNETO-OPTIC PROPERTIES OF QUENCHED THIN FILMS OF MNBI AND OPTICAL MEMORY EXPERIMENTS [J].

CHEN, D ;

AAGARD, RL ;

LIU, TS .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (03) :1395-&

[8] MNBI THIN FILMS - PHYSICAL PROPERTIES AND MEMORY APPLICATIONS [J].

CHEN, D ;

READY, JF ;

BERNAL, E .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (08) :3916-+

[9]

HUNT RP, 1969, IEEE T MAGNETICS, VMAG5, P700

[10] IDENTIFICATION AND MEASUREMENT OF PHASES IN MNBI THIN FILMS USING AN X-RAY DIFFRACTOMETRIC TECHNIQUE [J].

LIU, TS ;

KNUDSON, CI .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 5 (02) :K91-&

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