FREE-ION YIELDS, ELECTRON MOBILITIES, AND ELECTRON-ION RECOMBINATION COEFFICIENTS IN LIQUID TETRAMETHYLSILANE

被引：7

作者：

SHINSAKA, K ^{[1
]}

NAKAMURA, Y ^{[1
]}

ENDOU, K ^{[1
]}

HONDA, K ^{[1
]}

YAMADA, H ^{[1
]}

ISODA, K ^{[1
]}

UKAI, M ^{[1
]}

KOUCHI, N ^{[1
]}

HATANO, Y ^{[1
]}

机构：

[1] KANAZAWA INST TECHNOL,DEPT ELECTR,NONOICHI,ISHIKAWA 921,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1993年 / 327卷 / 01期

关键词：

D O I：

10.1016/0168-9002(93)91399-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Electron mobilities and electron-ion recombination coefficients have been determined at 253 K and 170 K by analysing transient electric current through a liquid tetramethylsilane sample. In a conductivity cell ionization was induced by X-ray pulse irradiation under a dc external electric field lower than 10.5 kV/cm. Also results on free-ion yield and electron mobility are discussed. Their dependence on temperature and electric field are investigated.

引用

页码：15 / 17

页数：3

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