GENERAL FUCHS-SONDHEIMER EXPRESSIONS FOR STRAIN COEFFICIENTS OF RESISTIVITY OF THIN METALLIC-FILMS

被引：8

作者：

TELLIER, CR

机构：

来源：

THIN SOLID FILMS | 1978年 / 48卷 / 03期

关键词：

D O I：

10.1016/0040-6090(78)90002-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：L9 / L13

页数：5

共 17 条

[1]

CAMPBELL DS, 1966, USE THIN FILMS PHYSI, P299

[2]

Chopra K.L, 1969, THIN FILM PHENOMENA

[3] EFFECT OF EXPANSION MISMATCH ON TEMPERATURE COEFFICIENT OF RESISTANCE OF THIN FILMS [J].

HALL, PM .

APPLIED PHYSICS LETTERS, 1968, 12 (06) :212-&

[4] TEMPERATURE COEFFICIENT OF RESISTANCE IN THIN METAL FILMS [J].

LEONARD, WF ;

RAMEY, RL .

JOURNAL OF APPLIED PHYSICS, 1966, 37 (09) :3634-&

[5] A THEORETICAL STUDY OF EFFECT OF ELASTIC STRAIN ON ELECTRICAL RESISTANCE OF THIN METAL FILMS [J].

MEIKSIN, ZH ;

HUDZINSKI, RA .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) :4490-+

[6] ELECTRICAL RESISTANCE-STRAIN CHARACTERISTICS OF THIN EVAPORATED METAL FILMS [J].

PARKER, RL ;

KRINSKY, A .

JOURNAL OF APPLIED PHYSICS, 1963, 34 (09) :2700-&

[7] SIZE EFFECT ON ELECTRICAL CONDUCTIVITY AND LONGITUDINAL GAUGE FACTOR OF THIN METAL FILMS [J].

REALE, C .

CZECHOSLOVAK JOURNAL OF PHYSICS SECTION B, 1971, B 21 (06) :662-&

[8]

SAVORNIN F, 1959, CR HEBD ACAD SCI, V248, P2458

[9] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

ADVANCES IN PHYSICS, 1952, 1 (01) :1-42

[10] EXACT AND APPROXIMATE EXPRESSIONS FOR TEMPERATURE-COEFFICIENT OF RESISTIVITY OF POLYCRYSTALLINE FILMS USING MAYADAS-SHATZKES MODEL [J].

TELLIER, CR ;

TOSSER, AJ .

THIN SOLID FILMS, 1977, 44 (02) :141-147

← 1 2 →