PRACTICAL RESOLUTION LIMITS OF IMAGING MICROANALYSIS WITH A SCANNING ION MICROPROBE

被引：41

作者：

CHABALA, JM ^{[1
]}

LEVISETTI, R ^{[1
]}

WANG, YL ^{[1
]}

机构：

[1] UNIV CHICAGO,DEPT PHYS,CHICAGO,IL 60637

来源：

APPLIED SURFACE SCIENCE | 1988年 / 32卷 / 1-2期

关键词：

D O I：

10.1016/0169-4332(88)90071-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：10 / 32

页数：23

相关论文

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