B, AS AND SI FIELD-ION SOURCES

[1] TOTAL ENERGY-DISTRIBUTIONS OF FIELD-EMITTED ELECTRONS AT HIGH-CURRENT DENSITY [J]. PHYSICAL REVIEW B, 1979, 19 (07): : 3353 - 3364

[2] MINIATURE ION SOURCES FOR ANALYTICAL INSTRUMENTS [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 739 - 742

[3] INTENSE FIELD-EMISSION ION-SOURCE OF LIQUID-METALS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1208 - 1208

[4] FIELD-ION SOURCES USING EUTECTIC ALLOYS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (07) : L379 - L382

[5] LOEFFLER KH, 1969, Z ANGEW PHYSIK, V27, P145

[6] ORLOFF J, 1979, SCANNING ELECTRON MI, V1, P39

[7] HIGH-INTENSITY SCANNING ION PROBE WITH SUBMICROMETER SPOT SIZE [J]. APPLIED PHYSICS LETTERS, 1979, 34 (05) : 310 - 312

[8] IMPROVED ELECTRON FILTER LENS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (07) : 802 - &

[9] ENERGY-DISTRIBUTION OF EHD EMITTED GOLD IONS [J]. JOURNAL DE PHYSIQUE LETTRES, 1979, 40 (09): : L207 - L211

[10] SWANSON LW, 1979, J VAC SCI TECHNOL, V16

[1] TOTAL ENERGY-DISTRIBUTIONS OF FIELD-EMITTED ELECTRONS AT HIGH-CURRENT DENSITY [J]. PHYSICAL REVIEW B, 1979, 19 (07): : 3353 - 3364

[2] MINIATURE ION SOURCES FOR ANALYTICAL INSTRUMENTS [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 739 - 742

[3] INTENSE FIELD-EMISSION ION-SOURCE OF LIQUID-METALS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1208 - 1208

[4] FIELD-ION SOURCES USING EUTECTIC ALLOYS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (07) : L379 - L382

[5] LOEFFLER KH, 1969, Z ANGEW PHYSIK, V27, P145

[6] ORLOFF J, 1979, SCANNING ELECTRON MI, V1, P39

[7] HIGH-INTENSITY SCANNING ION PROBE WITH SUBMICROMETER SPOT SIZE [J]. APPLIED PHYSICS LETTERS, 1979, 34 (05) : 310 - 312

[8] IMPROVED ELECTRON FILTER LENS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (07) : 802 - &

[9] ENERGY-DISTRIBUTION OF EHD EMITTED GOLD IONS [J]. JOURNAL DE PHYSIQUE LETTRES, 1979, 40 (09): : L207 - L211

[10] SWANSON LW, 1979, J VAC SCI TECHNOL, V16