TEXTURE ANALYSIS BY THE SCHULZ REFLECTION METHOD - DEFOCALIZATION CORRECTIONS FOR THIN-FILMS

A new method is described for correcting experimental data obtained from the texture analysis of thin films. The analysis employed for correcting the data usually requires the experimental curves of defocalization for a randomly oriented specimen. In view of difficulties in finding non-oriented films, a theoretical method for these corrections is proposed which uses the defocalization evolution for a bulk sample, the film thickness and the penetration depth of the incident beam in the material. This correction method is applied to a film of YBa2Cu3O7-delta on an SrTiO3 single-crystal substrate.