DEFOCUSING EFFECTS IN REFLECTION TECHNIQUE FOR DETERMINATION OF PREFERRED ORIENTATION

被引：31

作者：

HUIJSERG.EM ^{[1
]}

RIECK, GD ^{[1
]}

机构：

[1] EINDHOVEN UNIV TECHNOL,LAB PHYS CHEM,EINDHOVEN,NETHERLANDS

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1974年 / 7卷 / APR1期

关键词：

D O I：

10.1107/S002188987400954X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：286 / 290

页数：5

共 10 条

[1] ANALYSIS OF CERTAIN ERRORS IN THE X-RAY REFLECTION METHOD FOR THE QUANTITATIVE DETERMINATION OF PREFERRED ORIENTATIONS
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[2] DEFOCUSING PHENOMENON CONNECTED WITH GEOMETRY OF SCHULZ TEXTURE CHAMBER AND INCIDENCE ON MEASURED INTENSITY
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[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (DEC1) : 461 - &
[3] DETERMINATION OF RELATIVE INTENSITY IN X-RAY REFLECTION STUDY
FENG, C
[J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) : 3432 - &
[4] INFLUENCE OF INSTRUMENTAL ABERRATIONS ON THE SCHULTZ TECHNIQUE FOR THE MEASUREMENT OF POLE FIGURES
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[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1960, 11 (03): : 96 - 102
[5] QUANTITATIVE TEXTURE DETERMINATION WITHOUT A RANDOM STANDARD SAMPLE
GREWEN, J
SAUER, D
WAHL, HP
[J]. SCRIPTA METALLURGICA, 1969, 3 (02): : 53 - &
[6] HOLLAND JR, 1964, ADV XRAY ANAL, V7, P86
[7] FAN TEXTURE OF COMPOUND BA3CO2FE24O41 PRE-ALIGNED IN A MAGNETIC FIELD
HUIJSERGERITS, EM
RIECK, GD
VOGEL, DL
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 : 243 - +
[8] A DIRECT METHOD OF DETERMINING PREFERRED ORIENTATION OF A FLAT REFLECTION SAMPLE USING A GEIGER COUNTER X-RAY SPECTROMETER
SCHULZ, LG
[J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (11) : 1030 - 1032
[9] DEFOCUSING FOR SCHULZ TECHNIQUE OF DETERMINING PREFERRED ORIENTATION
TENCKHOFF, E
[J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (10) : 3944 - +
[10] DEFOCUSING CORRECTION FOR MEASUREMENT OF PREFERRED ORIENTATION
WILSON, D
BAINBRID.DW
[J]. METALLURGICAL TRANSACTIONS, 1971, 2 (10): : 2925 - &

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