A COMPLETE CHARACTERIZATION OF X-RAY-POLARIZATION STATE BY COMBINATION OF SINGLE AND MULTIPLE BRAGG-REFLECTIONS

被引：12

作者：

SHEN, Q ^{[1
]}

FINKELSTEIN, KD ^{[1
]}

机构：

[1] CORNELL UNIV,SCH APPL & ENGN PHYS,ITHACA,NY 14853

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 12期

关键词：

D O I：

10.1063/1.1144266

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a simple method for complete determination of the x-ray polarization state, using just one Bragg reflection from a single-crystal analyzer. For the linear polarization components P1 and P2, we show that the usual method of using a 90-degrees Bragg reflection can be extended to using any Bragg reflection with 20 not-equal 90-degrees. For circular component P3, we use the intensity modulation profile in an azimuthal rotation caused by the phase-sensitive interference around a multiple-beam Bragg reflection. The combination of the two measurements allows a straightforward complete determination of x-ray polarization, including an unpolarized component, in a broad applicable energy range.

引用

页码：3451 / 3455

页数：5

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