CHARACTERIZATION OF THE FREE-CARRIER CONCENTRATIONS IN DOPED BETA-SIC CRYSTALS BY RAMAN-SCATTERING

被引：132

作者：

YUGAMI, H ^{[1
]}

NAKASHIMA, S ^{[1
]}

MITSUISHI, A ^{[1
]}

UEMOTO, A ^{[1
]}

SHIGETA, M ^{[1
]}

FURUKAWA, K ^{[1
]}

SUZUKI, A ^{[1
]}

NAKAJIMA, S ^{[1
]}

机构：

[1] SHARP CORP,CENT RES LABS,CTR ENGN,TENRI,NARA 632,JAPAN

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 61卷 / 01期

关键词：

D O I：

10.1063/1.338830

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：354 / 358

页数：5

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