ASYMMETRIC STRUCTURE-ANALYSIS OF ACTIVE SURFACE-SITES BY IN-SITU POLARIZED TOTAL-REFLECTION FLUORESCENCE EXAFS

被引：17

作者：

ASAKURA, K ^{[1
]}

SHIRAI, M ^{[1
]}

IWASAWA, Y ^{[1
]}

机构：

[1] UNIV TOKYO,FAC SCI,DEPT CHEM,BUNKYO KU,TOKYO 113,JAPAN

来源：

CATALYSIS LETTERS | 1993年 / 20卷 / 1-2期

关键词：

POLARIZED TOTAL REFLECTION EXAFS; EXAFS OF CU ON ALPHA-QUARTZ; EXAFS OF COBALT OXIDE ON ALPHA-ALUMINA; EXAFS OF PLATINUM ON ALPHA-ALUMINA;

D O I：

10.1007/BF00772603

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

An in situ polarization-dependent total reflection fluorescence yield EXAFS system has been developed to analyze the asymmetric structures of catalytically active metal sites on single crystal surfaces. This technique separately reveals the bonding feature parallel and perpendicular to the support surface. The systems of Cu ion on alpha-quartz(0001), Co oxide on alpha-alumina(0001), and Pt4 on alpha-alumina(0001) were investigated as model surfaces of supported catalytic systems. The location of Cu sites on alpha-quartz(0001), the epitaxial growth mode of Co3O4 on alpha-alumina(0001), and the Pt raft structure with metal-support interaction in Pt4/alpha-alumina(0001) were observed.

引用

页码：117 / 124

页数：8

共 8 条

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