共 5 条
[1]
DISTORTION CORRECTION AND DEFLECTION CALIBRATION BY MEANS OF LASER INTERFEROMETRY IN AN ELECTRON-BEAM EXPOSURE SYSTEM
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1979, 16 (06)
:1710-1714
[2]
DAVIS DE, 1978, SOLID STATE TECHNOL, V61, P21
[3]
EB60 - AN ADVANCED DIRECT WAFER EXPOSURE ELECTRON-BEAM LITHOGRAPHY SYSTEM FOR HIGH-THROUGHPUT, HIGH-PRECISION, SUBMICRON PATTERN WRITING
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1987, 5 (01)
:61-65
[5]
SHIBAYAMA A, 1984, P IEEE INT S CIRCUIT