MEASUREMENT OF ETCHING AFTER IRRADIATION WITH CHARGED-PARTICLES BY USING THE MATRIX ACTIVATION

被引：2

作者：

VALLADON, M

BLONDIAUX, G

GIOVAGNOLI, A

KOEMMERER, C

DEBRUN, JL

机构：

来源：

关键词：

D O I：

10.1016/S0003-2670(01)84310-5

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：25 / 32

页数：8

共 9 条

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[3] 2 REACTIONS METHOD FOR ACCURATE ANALYSIS BY IRRADIATION WITH CHARGED-PARTICLES
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[7] DETERMINATION OF OXYGEN IN METALS AND SEMICONDUCTORS BY MEANS OF O-16(T,N)18 F REACTION
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[J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1977, 39 (1-2): : 385 - 395
[8] VALLADON M, J RADIOANAL CHEM
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