ON SCANNING-ELECTRON-MICROSCOPE CONDUCTION-MODE SIGNALS IN BULK SEMICONDUCTOR DEVICES - LINEAR GEOMETRY

被引:13
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GOPINATH, A
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10.1088/0022-3727/3/4/305
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O59 [应用物理学];
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页码:467 / &
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[2]   AN APPLICATION OF BETA CONDUCTIVITY TO MEASUREMENT OF RESISTIVITY DISTRIBUTION [J].
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