AN APPLICATION OF BETA CONDUCTIVITY TO MEASUREMENT OF RESISTIVITY DISTRIBUTION

被引：20

作者：

MUNAKATA, C

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1968年 / 1卷 / 06期

关键词：

D O I：

10.1088/0022-3735/1/6/313

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：639 / &

共 14 条

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[7] AN ELECTRON BEAM METHOD OF MEASURING RESISTIVITY DISTRIBUTION IN SEMICONDUCTORS [J].

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[8] A METHOD OF MEASURING LIFETIME FOR MINORITY CARRIERS INDUCED BY AN ELECTRON BEAM IN GERMANIUM [J].

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[9] ON VOLTAGE INDUCED BY AN ELECTRON BEAM IN A BULK SEMICONDUCTOR CRYSTAL [J].

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[10] ELECTRON VOLTAIC EFFECT AT A GRAIN BOUNDARY OF CDS [J].

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