A METHOD OF MEASURING LIFETIME FOR MINORITY CARRIERS INDUCED BY AN ELECTRON BEAM IN GERMANIUM

被引：8

作者：

MUNAKATA, C

TODOKORO, H

机构：

来源：

关键词：

D O I：

10.1143/JJAP.5.249

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：249 / +

页数：1

共 5 条

MAYBURG, S .

[2] DRIFT MOBILITIES IN SEMICONDUCTORS .1. GERMANIUM [J].

PRINCE, MB .

PHYSICAL REVIEW, 1953, 92 (03) :681-687

[3] MEASUREMENT OF CARRIER LIFETIMES IN GERMANIUM AND SILICON [J].

STEVENSON, DT ;

KEYES, RJ .

[4] MEASUREMENT OF SHORT CARRIER LIFETIMES [J].

WERTHEIM, GK ;

AUGUSTYNIAK, WM .

[5]

ZAREBA A, 1962, ACTA PHYS POL, V21, P371