MEASUREMENT OF SHORT CARRIER LIFETIMES

被引:28
作者
WERTHEIM, GK
AUGUSTYNIAK, WM
机构
关键词
D O I
10.1063/1.1715454
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:1062 / 1064
页数:3
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共 8 条
[1]  
CLADIS, 1956, REV SCI INSTR, V27, P83
[2]   A PULSE GENERATOR FOR THE MILLIMICROSECOND RANGE [J].
GARWIN, RL .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (11) :903-904
[3]   TEMPORARY TRAPS IN SILICON AND GERMANIUM [J].
HAYNES, JR ;
HORNBECK, JA .
PHYSICAL REVIEW, 1953, 90 (01) :152-153
[4]   ELECTRON BOMBARDMENT CONDUCTIVITY IN DIAMOND [J].
MCKAY, KG .
PHYSICAL REVIEW, 1948, 74 (11) :1606-1621
[5]   ELECTRON BOMBARDMENT CONDUCTIVITY IN DIAMOND .2. [J].
MCKAY, KG .
PHYSICAL REVIEW, 1950, 77 (06) :816-825
[6]   ELECTRON-HOLE PRODUCTION IN GERMANIUM BY ALPHA-PARTICLES [J].
MCKAY, KG .
PHYSICAL REVIEW, 1951, 84 (04) :829-832
[7]   ELECTRON MULTIPLICATION IN SILICON AND GERMANIUM [J].
MCKAY, KG ;
MCAFEE, KB .
PHYSICAL REVIEW, 1953, 91 (05) :1079-1084
[8]  
WERTHEIM GK, UNPUBLISHED