EXPONENTIAL PROJECTILE CHARGE DEPENDENCE OF AR-K AND NEK-X-RAY PRODUCTION BY FAST, HIGHLY IONIZED ARGON BEAMS IN THIN NEON TARGETS

被引：39

作者：

MOWAT, JR

SELLIN, IA

PEGG, DJ

PETERSON, RS

BROWN, MD

MACDONALD, JR

机构：

[1] UNIV TENNESSEE, KNOXVILLE, TN 37916 USA

[2] KANSAS STATE UNIV, MANHATTAN, KS 66506 USA

[3] OAK RIDGE NATL LAB, OAK RIDGE, TN 37830 USA

来源：

PHYSICAL REVIEW LETTERS | 1973年 / 30卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.30.1289

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1289 / 1292

页数：4

共 11 条

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[7]

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[8]

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[9] DEPENDENCE OF X-RAY YIELDS IN ARGON, KRYPTON, AND XENON UPON CHARGE STATE OF FLUORINE IONS AT 3597 MEV [J].

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[10] GENERAL DESCRIPTION OF K X-RAY DEEXCITATION OF TITANIUM [J].

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