DARK CURRENT-INDUCED IN LARGE CCD ARRAYS BY PROTON-INDUCED ELASTIC REACTIONS AND SINGLE TO MULTIPLE-EVENT SPALLATION REACTIONS

被引:2
作者
CHEN, L [1 ]
MCNULTY, PJ [1 ]
LARSON, S [1 ]
THOMPSON, DA [1 ]
MILLER, TL [1 ]
LEE, T [1 ]
机构
[1] EASTMAN KODAK CO,ROCHESTER,NY 14650
关键词
D O I
10.1109/23.340534
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Computer simulations of the non-ionizing energy loss deposited in sensitive volumes as a result of proton-induced spallation reactions agree with analytic models for large sensitive volumes exposed to high fluence. They predict unique features for small volumes and low-fluence exposures which are observed in exposures of large arrays of CCD pixels. Calculations of the number of spallation reactions per pixel correlate with the recently reported relative frequency of switching dark-current states.
引用
收藏
页码:1992 / 1998
页数:7
相关论文
共 10 条