学术探索
学术期刊
新闻热点
数据分析
智能评审

CORRELATION OF STRUCTURAL WITH OPTICAL MEASUREMENTS ON THIN ALUMINIUM FILMS EVAPORATED IN ULTRA HIGH VACUUM

被引：12
作者：
NEAL, WEJ
FANE, RW
GRIMES, NW
机构：
来源：
PHILOSOPHICAL MAGAZINE | 1970年 / 21卷 / 169期
关键词：
D O I：
10.1080/14786437008238404
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：167 / &
相关论文
共 21 条
[1]  
BAUER E, 1964, SINGLE CRYSTAL FILMS, P43
[2]  
CATHCART JV, 1963, ELLIPSOMETRY MEASURE
[3]   SOME NEW FORMULAS FOR DETERMINING THE OPTICAL CONSTANTS FROM MEASUREMENTS ON REFLECTED LIGHT [J].
DITCHBURN, RW .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1955, 45 (09) :743-748
[4]  
FANE RW, 1968, 4 P INT VAC C, P510
[5]   A POSSIBLE DETERMINATION OF THE ACTIVATION ENERGY FOR SELF-DIFFUSION IN ALUMINIUM [J].
FEDERIGHI, T .
PHILOSOPHICAL MAGAZINE, 1959, 4 (40) :502-510
[6]  
FERRAGLIO PL, 1967, THIN SOLID FILMS, V1, P199
[7]   A VARIANCE ANALYSIS OF BROADENED X-RAY DIFFRACTION LINES FROM EVAPORATED THIN FILMS OF ALUMINIUM [J].
GRIMES, NW ;
PEARSON, JM ;
FANE, RW ;
NEAL, WEJ .
PHILOSOPHICAL MAGAZINE, 1970, 21 (169) :177-&
[8]  
HAAS G, 1961, J OPT SOC AM, V51, P719
[9]  
KOOY C, 1966, BASIC PROBLEMS THIN, P181
[10]   OPTISCHE KONSTANTEN AUFGEDAMPFTER EISENSCHICHTEN [J].
MEYER, G .
ZEITSCHRIFT FUR PHYSIK, 1962, 168 (02) :169-&
123