SEMICONDUCTOR ASSESSMENT USING PHOTOTHERMAL RADIOMETRY

被引:11
作者
SHEARD, SJ [1 ]
SOMEKH, MG [1 ]
机构
[1] UNIV LONDON UNIV COLL,LONDON WC1E 7JE,ENGLAND
来源
INFRARED PHYSICS | 1988年 / 28卷 / 05期
关键词
D O I
10.1016/0020-0891(88)90047-4
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:287 / 292
页数:6
相关论文
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