EVIDENCE FOR INTERNAL ROTATION IN THE FINE STRUCTURE OF THE INFRARED ABSORPTION OF OXYGEN IN SILICON

被引：71

作者：

HROSTOWSKI, HJ

ALDER, BJ

机构：

来源：

关键词：

D O I：

10.1063/1.1731397

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：980 / 990

页数：11

共 17 条

[1] BOND WL, UNPUBLISHED
[2] LATTICE VIBRATIONS IN SILICON AND GERMANIUM
BROCKHOUSE, BN
[J]. PHYSICAL REVIEW LETTERS, 1959, 2 (06) : 256 - 258
[3] The two-minima problem and the ammonia molecule
Dennison, DM
Uhlenbeck, GE
[J]. PHYSICAL REVIEW, 1932, 41 (03): : 313 - 321
[4] FULLER, 1954, PHYS REV, V96, P833
[5] FULLER, 1955, ACTA METALLURGICA, V3, P1
[6] THERMAL EXPANSION OF SOME CRYSTALS WITH THE DIAMOND STRUCTURE
GIBBONS, DF
[J]. PHYSICAL REVIEW, 1958, 112 (01): : 136 - 140
[7] HERTZBERG G, 1945, INFRARED RAMAN SPECT, P252
[8] HIRSCHFELDER JO, 1954, MOL THEORY GASES LIQ, P32
[9] INFRARED SPECTRA OF HEAT TREATMENT CENTERS IN SILICON
HROSTOWSKI, HJ
KAISER, RH
[J]. PHYSICAL REVIEW LETTERS, 1958, 1 (06) : 199 - 200
[10] THE SOLUBILITY OF OXYGEN IN SILICON
HROSTOWSKI, HJ
KAISER, RH
[J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1959, 9 (3-4) : 214 - 216