ACHROMATIC 3-WAVE (OR MORE) LATERAL SHEARING INTERFEROMETER

被引:128
作者
PRIMOT, J
SOGNO, L
机构
[1] Office National d’Etudes et de Recherches Aérospatiales, Châtiiion
来源
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1995年 / 12卷 / 12期
关键词
INTERFEROMETRY; OPTICAL TESTING; ADAPTIVE OPTICS; ACTIVE OPTICS; WAVE-FRONT SENSING; MICROLENS ARRAY;
D O I
10.1364/JOSAA.12.002679
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new kind of lateral shearing interferometer, called the three-wave lateral shearing interferometer, was previously described [Appl. Opt. 32, 6242 (1993)]. As this instrument was monochromatic and its usable light efficiency was poor, the proposed setup was well suited only for a class of wave-front sensing problems, such as optical testing, in which the source can be easily adapted. A new achromatic setup adapted to low light level applications is presented. Three replicas of the analyzed wave front are obtained by Fourier filtering of the orders diffracted by a microlens array. An important feature of these new devices is their great similarity to another class of wave-front sensors based on the Hartmann test. (C) 1995 Optical Society of America.
引用
收藏
页码:2679 / 2685
页数:7
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