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UNIFORMITY QUANTIFICATION OF LUBRICANT LAYER ON MAGNETIC RECORDING MEDIA
被引:22
作者
:
KIMACHI, Y
论文数:
0
引用数:
0
h-index:
0
机构:
NTT, Tokai, Jpn, NTT, Tokai, Jpn
KIMACHI, Y
YOSHIMURA, F
论文数:
0
引用数:
0
h-index:
0
机构:
NTT, Tokai, Jpn, NTT, Tokai, Jpn
YOSHIMURA, F
HOSHINO, M
论文数:
0
引用数:
0
h-index:
0
机构:
NTT, Tokai, Jpn, NTT, Tokai, Jpn
HOSHINO, M
TERADA, A
论文数:
0
引用数:
0
h-index:
0
机构:
NTT, Tokai, Jpn, NTT, Tokai, Jpn
TERADA, A
机构
:
[1]
NTT, Tokai, Jpn, NTT, Tokai, Jpn
来源
:
IEEE TRANSACTIONS ON MAGNETICS
|
1987年
/ 23卷
/ 05期
关键词
:
D O I
:
10.1109/TMAG.1987.1065342
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
8
引用
收藏
页码:2392 / 2394
页数:3
相关论文
共 8 条
[1]
ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY
[J].
FADLEY, CS
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Hawaii at Manoa, Dep of, Chemistry, Honolulu, HI, USA, Univ of Hawaii at Manoa, Dep of Chemistry, Honolulu, HI, USA
FADLEY, CS
.
PROGRESS IN SURFACE SCIENCE,
1984,
16
(03)
:275
-388
[2]
INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS
[J].
FADLEY, CS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
FADLEY, CS
.
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1974,
5
(NOV-D)
:725
-754
[3]
ESCA DETERMINATION OF FLUOROCARBON LUBRICANT FILM THICKNESS ON MAGNETIC DISK MEDIA
[J].
LINDER, RE
论文数:
0
引用数:
0
h-index:
0
机构:
SPERRY UNIVAC,ST PAUL,MN 55165
SPERRY UNIVAC,ST PAUL,MN 55165
LINDER, RE
;
MEE, PB
论文数:
0
引用数:
0
h-index:
0
机构:
SPERRY UNIVAC,ST PAUL,MN 55165
SPERRY UNIVAC,ST PAUL,MN 55165
MEE, PB
.
IEEE TRANSACTIONS ON MAGNETICS,
1982,
18
(06)
:1073
-1076
[4]
USING ANGLE RESOLVED ESCA TO CHARACTERIZE WINCHESTER DISKS
[J].
MOULDER, JF
论文数:
0
引用数:
0
h-index:
0
MOULDER, JF
;
HAMMOND, JS
论文数:
0
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0
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0
HAMMOND, JS
;
SMITH, KL
论文数:
0
引用数:
0
h-index:
0
SMITH, KL
.
APPLIED SURFACE SCIENCE,
1986,
25
(04)
:446
-454
[5]
HARTREE-SLATER SUBSHELL PHOTOIONIZATION CROSS-SECTIONS AT 1254 AND 1487EV
[J].
SCOFIELD, JH
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF,LAWRENCE LIVERMORE LAB,LIVERMORE,CA 94550
UNIV CALIF,LAWRENCE LIVERMORE LAB,LIVERMORE,CA 94550
SCOFIELD, JH
.
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1976,
8
(02)
:129
-137
[6]
Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103
[7]
WEAR-RESISTANCE AND SIGNAL-TO-NOISE RATIO IN GAMMA-FE2O3 THIN-FILM DISKS
[J].
TERADA, A
论文数:
0
引用数:
0
h-index:
0
TERADA, A
;
ISHII, O
论文数:
0
引用数:
0
h-index:
0
ISHII, O
;
OHTA, S
论文数:
0
引用数:
0
h-index:
0
OHTA, S
.
IEEE TRANSACTIONS ON MAGNETICS,
1985,
21
(05)
:1521
-1523
[8]
EMPIRICAL ATOMIC SENSITIVITY FACTORS FOR QUANTITATIVE-ANALYSIS BY ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS
[J].
WAGNER, CD
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
WAGNER, CD
;
DAVIS, LE
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
DAVIS, LE
;
ZELLER, MV
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
ZELLER, MV
;
TAYLOR, JA
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
TAYLOR, JA
;
RAYMOND, RH
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
RAYMOND, RH
;
GALE, LH
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
GALE, LH
.
SURFACE AND INTERFACE ANALYSIS,
1981,
3
(05)
:211
-225
←
1
→
共 8 条
[1]
ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY
[J].
FADLEY, CS
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Hawaii at Manoa, Dep of, Chemistry, Honolulu, HI, USA, Univ of Hawaii at Manoa, Dep of Chemistry, Honolulu, HI, USA
FADLEY, CS
.
PROGRESS IN SURFACE SCIENCE,
1984,
16
(03)
:275
-388
[2]
INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS
[J].
FADLEY, CS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
FADLEY, CS
.
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1974,
5
(NOV-D)
:725
-754
[3]
ESCA DETERMINATION OF FLUOROCARBON LUBRICANT FILM THICKNESS ON MAGNETIC DISK MEDIA
[J].
LINDER, RE
论文数:
0
引用数:
0
h-index:
0
机构:
SPERRY UNIVAC,ST PAUL,MN 55165
SPERRY UNIVAC,ST PAUL,MN 55165
LINDER, RE
;
MEE, PB
论文数:
0
引用数:
0
h-index:
0
机构:
SPERRY UNIVAC,ST PAUL,MN 55165
SPERRY UNIVAC,ST PAUL,MN 55165
MEE, PB
.
IEEE TRANSACTIONS ON MAGNETICS,
1982,
18
(06)
:1073
-1076
[4]
USING ANGLE RESOLVED ESCA TO CHARACTERIZE WINCHESTER DISKS
[J].
MOULDER, JF
论文数:
0
引用数:
0
h-index:
0
MOULDER, JF
;
HAMMOND, JS
论文数:
0
引用数:
0
h-index:
0
HAMMOND, JS
;
SMITH, KL
论文数:
0
引用数:
0
h-index:
0
SMITH, KL
.
APPLIED SURFACE SCIENCE,
1986,
25
(04)
:446
-454
[5]
HARTREE-SLATER SUBSHELL PHOTOIONIZATION CROSS-SECTIONS AT 1254 AND 1487EV
[J].
SCOFIELD, JH
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF,LAWRENCE LIVERMORE LAB,LIVERMORE,CA 94550
UNIV CALIF,LAWRENCE LIVERMORE LAB,LIVERMORE,CA 94550
SCOFIELD, JH
.
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1976,
8
(02)
:129
-137
[6]
Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103
[7]
WEAR-RESISTANCE AND SIGNAL-TO-NOISE RATIO IN GAMMA-FE2O3 THIN-FILM DISKS
[J].
TERADA, A
论文数:
0
引用数:
0
h-index:
0
TERADA, A
;
ISHII, O
论文数:
0
引用数:
0
h-index:
0
ISHII, O
;
OHTA, S
论文数:
0
引用数:
0
h-index:
0
OHTA, S
.
IEEE TRANSACTIONS ON MAGNETICS,
1985,
21
(05)
:1521
-1523
[8]
EMPIRICAL ATOMIC SENSITIVITY FACTORS FOR QUANTITATIVE-ANALYSIS BY ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS
[J].
WAGNER, CD
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
WAGNER, CD
;
DAVIS, LE
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
DAVIS, LE
;
ZELLER, MV
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
ZELLER, MV
;
TAYLOR, JA
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
TAYLOR, JA
;
RAYMOND, RH
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
RAYMOND, RH
;
GALE, LH
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
GALE, LH
.
SURFACE AND INTERFACE ANALYSIS,
1981,
3
(05)
:211
-225
←
1
→