UNIFORMITY QUANTIFICATION OF LUBRICANT LAYER ON MAGNETIC RECORDING MEDIA

被引:22
作者
KIMACHI, Y
YOSHIMURA, F
HOSHINO, M
TERADA, A
机构
[1] NTT, Tokai, Jpn, NTT, Tokai, Jpn
关键词
D O I
10.1109/TMAG.1987.1065342
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
8
引用
收藏
页码:2392 / 2394
页数:3
相关论文
共 8 条
[1]   ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
FADLEY, CS .
PROGRESS IN SURFACE SCIENCE, 1984, 16 (03) :275-388
[2]   INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS [J].
FADLEY, CS .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :725-754
[3]   ESCA DETERMINATION OF FLUOROCARBON LUBRICANT FILM THICKNESS ON MAGNETIC DISK MEDIA [J].
LINDER, RE ;
MEE, PB .
IEEE TRANSACTIONS ON MAGNETICS, 1982, 18 (06) :1073-1076
[4]   USING ANGLE RESOLVED ESCA TO CHARACTERIZE WINCHESTER DISKS [J].
MOULDER, JF ;
HAMMOND, JS ;
SMITH, KL .
APPLIED SURFACE SCIENCE, 1986, 25 (04) :446-454
[5]   HARTREE-SLATER SUBSHELL PHOTOIONIZATION CROSS-SECTIONS AT 1254 AND 1487EV [J].
SCOFIELD, JH .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (02) :129-137
[6]  
Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103
[7]   WEAR-RESISTANCE AND SIGNAL-TO-NOISE RATIO IN GAMMA-FE2O3 THIN-FILM DISKS [J].
TERADA, A ;
ISHII, O ;
OHTA, S .
IEEE TRANSACTIONS ON MAGNETICS, 1985, 21 (05) :1521-1523
[8]   EMPIRICAL ATOMIC SENSITIVITY FACTORS FOR QUANTITATIVE-ANALYSIS BY ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS [J].
WAGNER, CD ;
DAVIS, LE ;
ZELLER, MV ;
TAYLOR, JA ;
RAYMOND, RH ;
GALE, LH .
SURFACE AND INTERFACE ANALYSIS, 1981, 3 (05) :211-225