ATOMIC-STRUCTURE OF A SIGMA-99 GRAIN-BOUNDARY IN ALUMINUM - A COMPARISON BETWEEN ATOMIC-RESOLUTION OBSERVATION AND PAIR-POTENTIAL AND EMBEDDED-ATOM SIMULATIONS

被引：36

作者：

DAHMEN, U

HETHERINGTON, CJD

OKEEFE, MA

WESTMACOTT, KH

MILLS, MJ

DAW, MS

VITEK, V

机构：

[1] SANDIA NATL LABS,LIVERMORE,CA 94551

[2] HOSP UNIV PENN,DEPT MAT SCI,PHILADELPHIA,PA 19104

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1990年 / 62卷 / 05期

基金：

美国国家科学基金会;

关键词：

Atomic resolution images - Atomic-resolution - Atomistic calculations - Atomistic modelling - Degree of coincidence - Embedded-atom method - Image simulations - Tilt boundaries;

D O I：

10.1080/09500839008215153

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An atomic-resolution image of a symmetrical £99 {557} <110> tilt boundary in aluminium is compared with images simulated from models based on atomistic calculations using pair potentials and the embedded-atom method. The two methods for atomistic modelling result in very similar structures, and image simulations based on these structures closely match the experimental results. This study shows that high-resolution electron microscopy can now be used to assess quantitatively the degree of coincidence between experimental and theoretical atomic structures of high-£ grain boundaries. © 1990 Taylor & Francis Group, LLC.

引用

页码：327 / 335

页数：9

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