SOME RELIABILITY CONSIDERATIONS PERTAINING TO LSI TECHNOLOGY

被引：8

作者：

SCHLACTER, MM

KEEN, RS

SCHNABLE, GL

机构：

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1971年 / SC 6卷 / 05期

关键词：

D O I：

10.1109/JSSC.1971.1050195

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：327 / +

页数：1

共 50 条

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