DIRECT OBSERVATION OF MULTIPLICATION OF DISLOCATIONS IN IRON SINGLE CRYSTAL BY HIGH VOLTAGE ELECTRON MICROSCOPY (HVEM)

被引：14

作者：

SAKA, H

DOI, M

IMURA, T

机构：

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1970年 / 29卷 / 03期

关键词：

D O I：

10.1143/JPSJ.29.803

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

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页码：803 / &

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共 4 条

[1] BEHAVIOR OF DISLOCATIONS IN FE-3 PERCENT SI UNDER STRESS [J].

FURUBAYASHI, EI .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1969, 27 (01) :130-+

[2] A DIRECT METHOD TO INVESTIGATE DYNAMICAL PROPERTIES OF DISLOCATIONS BASED ON HIGH VOLTAGE ELECTRON MICROSCOPY [J].

IMURA, T ;

SAKA, H ;

YUKAWA, N .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1969, 8 (03) :405-&

[3] ON PREPARATION OF TENSILE TEST PIECES FOR TRANSMISSION ELECTRON MICROSCOPIC OBSERVATION [J].

SAKA, H ;

IMURA, T .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1969, 8 (03) :406-&

[4] STRESS MEASURABLE TENSILE DEVICE FOR ELECTRON MICROSCOPIC OBSERVATION [J].

SAKA, H ;

IMURA, T ;

YUKAWA, N ;

IGARASHI, I .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1968, 25 (03) :906-&