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THERMAL-STABILITY OF PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS .1. EFFECTS OF FILM THICKNESS AND GRAIN-SIZE OF PB-IN-AU BASE ELECTRODES
被引:35
作者
:
MURAKAMI, M
论文数:
0
引用数:
0
h-index:
0
MURAKAMI, M
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1981年
/ 52卷
/ 03期
关键词
:
D O I
:
10.1063/1.329757
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1309 / 1319
页数:11
相关论文
共 24 条
[1]
INVESTIGATION OF THERMAL CYCLING OF PB-ALLOY JOSEPHSON TUNNELING GATES
BASAVAIAH, S
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
BASAVAIAH, S
GREINER, JH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
GREINER, JH
[J].
JOURNAL OF APPLIED PHYSICS,
1977,
48
(11)
: 4630
-
4633
[2]
Basavaiah S., 1978, Cryogenics, V18, P11, DOI 10.1016/0011-2275(78)90131-5
[3]
BASAVAIAH S, 1978, J PHYS PARIS SC6, V39, P1247
[4]
INFLUENCE OF OXYGEN ON SURFACE MOBILITY OF TIN ATOMS IN THIN FILMS
CASWELL, HL
论文数:
0
引用数:
0
h-index:
0
CASWELL, HL
BUDO, Y
论文数:
0
引用数:
0
h-index:
0
BUDO, Y
[J].
JOURNAL OF APPLIED PHYSICS,
1964,
35
(3P1)
: 644
-
&
[5]
LOW-TEMPERATURE PROPERTIES OF EVAPORATED LEAD FILMS
CASWELL, HL
论文数:
0
引用数:
0
h-index:
0
CASWELL, HL
PRIEST, JR
论文数:
0
引用数:
0
h-index:
0
PRIEST, JR
BUDO, Y
论文数:
0
引用数:
0
h-index:
0
BUDO, Y
[J].
JOURNAL OF APPLIED PHYSICS,
1963,
34
(11)
: 3261
-
&
[6]
GRAY DE, 1972, AM I PHYSICS HDB
[7]
FABRICATION PROCESS FOR JOSEPHSON INTEGRATED-CIRCUITS
GREINER, JH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
GREINER, JH
KIRCHER, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
KIRCHER, CJ
KLEPNER, SP
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
KLEPNER, SP
LAHIRI, SK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
LAHIRI, SK
WARNECKE, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
WARNECKE, AJ
BASAVAIAH, S
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BASAVAIAH, S
YEN, ET
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
YEN, ET
BAKER, JM
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BAKER, JM
BROSIOUS, PR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BROSIOUS, PR
HUANG, HCW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
HUANG, HCW
MURAKAMI, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
MURAKAMI, M
AMES, I
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
AMES, I
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1980,
24
(02)
: 195
-
205
[8]
HIGH-RELIABILITY PB-ALLOY JOSEPHSON-JUNCTIONS FOR INTEGRATED-CIRCUITS
HUANG, HCW
论文数:
0
引用数:
0
h-index:
0
HUANG, HCW
BASAVAIAH, S
论文数:
0
引用数:
0
h-index:
0
BASAVAIAH, S
KIRCHER, CJ
论文数:
0
引用数:
0
h-index:
0
KIRCHER, CJ
HARRIS, EP
论文数:
0
引用数:
0
h-index:
0
HARRIS, EP
MURAKAMI, M
论文数:
0
引用数:
0
h-index:
0
MURAKAMI, M
KLEPNER, SP
论文数:
0
引用数:
0
h-index:
0
KLEPNER, SP
GREINER, JH
论文数:
0
引用数:
0
h-index:
0
GREINER, JH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(10)
: 1979
-
1987
[9]
KUAN TS, 1980, RC8459 IBM RES REP
[10]
STRESS RELIEF AND HILLOCK FORMATION IN THIN LEAD FILMS
LAHIRI, SK
论文数:
0
引用数:
0
h-index:
0
LAHIRI, SK
[J].
JOURNAL OF APPLIED PHYSICS,
1970,
41
(07)
: 3172
-
&
←
1
2
3
→
共 24 条
[1]
INVESTIGATION OF THERMAL CYCLING OF PB-ALLOY JOSEPHSON TUNNELING GATES
BASAVAIAH, S
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
BASAVAIAH, S
GREINER, JH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
GREINER, JH
[J].
JOURNAL OF APPLIED PHYSICS,
1977,
48
(11)
: 4630
-
4633
[2]
Basavaiah S., 1978, Cryogenics, V18, P11, DOI 10.1016/0011-2275(78)90131-5
[3]
BASAVAIAH S, 1978, J PHYS PARIS SC6, V39, P1247
[4]
INFLUENCE OF OXYGEN ON SURFACE MOBILITY OF TIN ATOMS IN THIN FILMS
CASWELL, HL
论文数:
0
引用数:
0
h-index:
0
CASWELL, HL
BUDO, Y
论文数:
0
引用数:
0
h-index:
0
BUDO, Y
[J].
JOURNAL OF APPLIED PHYSICS,
1964,
35
(3P1)
: 644
-
&
[5]
LOW-TEMPERATURE PROPERTIES OF EVAPORATED LEAD FILMS
CASWELL, HL
论文数:
0
引用数:
0
h-index:
0
CASWELL, HL
PRIEST, JR
论文数:
0
引用数:
0
h-index:
0
PRIEST, JR
BUDO, Y
论文数:
0
引用数:
0
h-index:
0
BUDO, Y
[J].
JOURNAL OF APPLIED PHYSICS,
1963,
34
(11)
: 3261
-
&
[6]
GRAY DE, 1972, AM I PHYSICS HDB
[7]
FABRICATION PROCESS FOR JOSEPHSON INTEGRATED-CIRCUITS
GREINER, JH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
GREINER, JH
KIRCHER, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
KIRCHER, CJ
KLEPNER, SP
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
KLEPNER, SP
LAHIRI, SK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
LAHIRI, SK
WARNECKE, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
WARNECKE, AJ
BASAVAIAH, S
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BASAVAIAH, S
YEN, ET
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
YEN, ET
BAKER, JM
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BAKER, JM
BROSIOUS, PR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BROSIOUS, PR
HUANG, HCW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
HUANG, HCW
MURAKAMI, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
MURAKAMI, M
AMES, I
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
AMES, I
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1980,
24
(02)
: 195
-
205
[8]
HIGH-RELIABILITY PB-ALLOY JOSEPHSON-JUNCTIONS FOR INTEGRATED-CIRCUITS
HUANG, HCW
论文数:
0
引用数:
0
h-index:
0
HUANG, HCW
BASAVAIAH, S
论文数:
0
引用数:
0
h-index:
0
BASAVAIAH, S
KIRCHER, CJ
论文数:
0
引用数:
0
h-index:
0
KIRCHER, CJ
HARRIS, EP
论文数:
0
引用数:
0
h-index:
0
HARRIS, EP
MURAKAMI, M
论文数:
0
引用数:
0
h-index:
0
MURAKAMI, M
KLEPNER, SP
论文数:
0
引用数:
0
h-index:
0
KLEPNER, SP
GREINER, JH
论文数:
0
引用数:
0
h-index:
0
GREINER, JH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(10)
: 1979
-
1987
[9]
KUAN TS, 1980, RC8459 IBM RES REP
[10]
STRESS RELIEF AND HILLOCK FORMATION IN THIN LEAD FILMS
LAHIRI, SK
论文数:
0
引用数:
0
h-index:
0
LAHIRI, SK
[J].
JOURNAL OF APPLIED PHYSICS,
1970,
41
(07)
: 3172
-
&
←
1
2
3
→