AN INVESTIGATION OF AIR-GROWN YTTRIUM-OXIDE AND EXPERIMENTAL-DETERMINATION OF THE SPUTTERING YIELD AND THE INELASTIC MEAN FREE-PATH

被引：43

作者：

REICHL, R

GAUKLER, KH

机构：

来源：

APPLIED SURFACE SCIENCE | 1986年 / 26卷 / 02期

关键词：

D O I：

10.1016/0169-4332(86)90005-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：196 / 210

页数：15

共 19 条

[1]

Barr T L, 1978, ASTM STP, V643, P83

[2] ESCA STUDY OF TERMINATION OF PASSIVATION OF ELEMENTAL METALS [J].

BARR, TL .

JOURNAL OF PHYSICAL CHEMISTRY, 1978, 82 (16) :1801-1810

[3] RELATIVE INTENSITIES IN X-RAY PHOTO-ELECTRON SPECTRA .9. ESTIMATES FOR PHOTO-ELECTRON MEAN FREE PATHS TAKING INTO ACCOUNT ELASTIC COLLISIONS IN A SOLID [J].

BASCHENKO, OA ;

NEFEDOV, VI .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1982, 27 (02) :109-118

[4]

BRUECK M, 1983, THESIS TUEBINGEN

[5] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF INTERACTION OF OXYGEN AND NITRIC-OXIDE WITH ALUMINUM [J].

CARLEY, AF ;

ROBERTS, MW .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1978, 363 (1714) :403-424

[6] MANY-BODY PROCESSES IN X-RAY PHOTOEMISSION LINE-SHAPES FROM LI, NA, MG, AND AL METALS [J].

CITRIN, PH ;

WERTHEIM, GK ;

BAER, Y .

PHYSICAL REVIEW B, 1977, 16 (10) :4256-4282

[7] ESCAPE DEPTH OF AUGER ELECTRONS - THE ELASTIC-SCATTERING EFFECT [J].

FERRON, J ;

GOLDBERG, EC ;

DEBERNARDEZ, LS ;

BUITRAGO, RH .

SURFACE SCIENCE, 1982, 123 (2-3) :239-246

[8] ELECTRONIC-STRUCTURE OF YTTRIUM HYDRIDE STUDIED BY X-RAY PHOTOEMISSION SPECTROSCOPY [J].

FUJIMORI, A ;

SCHLAPBACH, L .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (02) :341-351

[9] SURFACE-DEFECTS OF TIO2(110) - A COMBINED XPS, XAES AND ELS STUDY [J].

GOPEL, W ;

ANDERSON, JA ;

FRANKEL, D ;

JAEHNIG, M ;

PHILLIPS, K ;

SCHAFER, JA ;

ROCKER, G .

SURFACE SCIENCE, 1984, 139 (2-3) :333-346

[10] INFLUENCE OF REACTIVE GASES ON SPUTTERING AND SECONDARY ION EMISSION - OXIDATION OF TITANIUM AND VANADIUM DURING ENERGETIC PARTICLE IRRADIATION [J].

HOFER, WO ;

MARTIN, PJ .

APPLIED PHYSICS, 1978, 16 (03) :271-278

← 1 2 →