GAAS EPITAXY AND HETEROEPITAXY - A SCANNING TUNNELING MICROSCOPY STUDY

被引:27
作者
BIEGELSEN, DK
SWARTZ, LE
BRINGANS, RD
机构
[1] Xerox Palo Alto Research Center, Palo Alto, California
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期
关键词
D O I
10.1116/1.577085
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper, we will compare and contrast scanning tunneling microscopy images of homoepitaxially grown GaAs (100) and heteroepitaxially grown Si (100) :As and Si (100) :GaAs. Layers are grown by molecular beam epitaxy and imaged in situ. All samples are deposited under As-stabilized conditions. The GaAs homoepitaxial surface consists of 2X4 cells having predominantly three As-As dimers/cell. The earliest stages of heteroepitaxy are shown, including bare vicinal Si surfaces, the more ordered As-dimer terminated surface, and finally, a vicinal Si substrate with approximately two bilayers of GaAs. The later film shows essentially uniform two-dimensional topographic coverage but chemical inhomogeneity of dimer units. © 1990, American Vacuum Society. All rights reserved.
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页码:280 / 283
页数:4
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