Oxide-Oxide Interactions Studied by Transmission Electron Microscopy

被引：4

作者：

Pilliar, R. M. ^{[1
]}

Carruthers, T. G. ^{[2
]}

Nutting, J. ^{[2
]}

机构：

[1] McMaster Univ, Dept Met, Hamilton, ON, Canada

[2] Univ Leeds, Houldsworth Sch Appl Sci, Leeds, W Yorkshire, England

来源：

JOURNAL OF MATERIALS SCIENCE | 1967年 / 2卷 / 01期

关键词：

D O I：

10.1007/BF00550049

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al(2)O(3) and NiO and Al(2)O(3) by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion.

引用

页码：28 / 32

页数：5