MAGNETOREFLECTANCE AND MAGNETIZATION OF THE SEMIMAGNETIC SEMICONDUCTOR CD1-XFEXSE

被引:35
作者
TWARDOWSKI, A
PAKULA, K
PEREZ, I
WISE, P
CROW, JE
机构
[1] TEMPLE UNIV, DEPT PHYS, PHILADELPHIA, PA 19122 USA
[2] FLORIDA STATE UNIV, MARTECH, TALLAHASSEE, FL 32306 USA
关键词
D O I
10.1103/PhysRevB.42.7567
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Magnetoreflectance measurements of excitonic interband transitions are used to study exchange interaction between band electrons and localized Fe d electrons in hexagonal Cd1-xFexSe (x0.13) at T=1.9 K and B5 T. Combining exciton splitting with the magnetization of the same samples, we determined the difference between conduction- and valence-band exchange constants N0±-N02=1.85 eV. Given from previous work N0±=0.25 eV, the value N02=-1.6 eV is obtained. We also demonstrate that the band splittings are parametrized by macroscopic magnetization for the magnetic field oriented parallel as well as perpendicular to the crystal hexagonal axis. Additionally, we present a theoretical model for magnetization, x<0.05. © 1990 The American Physical Society.
引用
收藏
页码:7567 / 7575
页数:9
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