SURFACE-DIFFUSION IN THE SOLID-ON-SOLID MODEL

被引:30
作者
SEARSON, PC [1 ]
LI, R [1 ]
SIERADZKI, K [1 ]
机构
[1] ARIZONA STATE UNIV,TEMPE,AZ 85287
关键词
D O I
10.1103/PhysRevLett.74.1395
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We present results in 1+1 and 2+1 dimensions for surface diffusion controlled profile relaxation for the solid-on-solid model above and below the roughening transition. For all cases examined we found that the characteristic time scale for the decay of a sinusoidal profile scaled with the wavelength L as Lz where 4. These results can be understood in terms of the anomalous diffusion displayed by tracer atoms whose root mean square displacement scaled as t1/4. © 1995 The American Physical Society.
引用
收藏
页码:1395 / 1398
页数:4
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