NOVEL SPECIMEN STAGE PERMITTING HIGH-RESOLUTION ELECTRON-MICROSCOPY AT LOW-TEMPERATURES

被引:31
作者
HEIDE, HG [1 ]
URBAN, K
机构
[1] Max Planck Gesell, Fritz Haber Inst, Inst Elektronenmikroskopie, D-14195 Berlin, GERMANY
[2] Max Planck Inst Metallforsch, Inst Phys, Stuttgart, GERMANY
[3] Max Planck Gesell, Fritz Haber Inst, Inst Elektronenmikroskopie, D-14195 Berlin, GERMANY
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1972年 / 5卷 / 08期
关键词
D O I
10.1088/0022-3735/5/8/026
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:803 / +
页数:1
相关论文
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