NOVEL SPECIMEN STAGE PERMITTING HIGH-RESOLUTION ELECTRON-MICROSCOPY AT LOW-TEMPERATURES

被引：31

作者：

HEIDE, HG ^{[1
]}

URBAN, K

机构：

[1] Max Planck Gesell, Fritz Haber Inst, Inst Elektronenmikroskopie, D-14195 Berlin, GERMANY

[2] Max Planck Inst Metallforsch, Inst Phys, Stuttgart, GERMANY

[3] Max Planck Gesell, Fritz Haber Inst, Inst Elektronenmikroskopie, D-14195 Berlin, GERMANY

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1972年 / 5卷 / 08期

关键词：

D O I：

10.1088/0022-3735/5/8/026

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：803 / +

页数：1

共 41 条

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