DEEP LEVELS IN ELECTRON-IRRADIATED EDGE-DEFINED FILM-FED GROWTH RIBBON SILICON

被引:11
作者
JAWOROWSKI, AE
PIERCE, CB
BURDICK, S
CORBETT, JW
HANOKA, JI
机构
关键词
D O I
10.1063/1.329155
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:3337 / 3340
页数:4
相关论文
共 20 条
[1]   NEW MECHANISM FOR INTERSTITIAL MIGRATION [J].
BOURGOIN, JC ;
CORBETT, JW .
PHYSICS LETTERS A, 1972, A 38 (02) :135-&
[2]   ENHANCED DIFFUSION MECHANISMS [J].
BOURGOIN, JC ;
CORBETT, JW .
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1978, 36 (3-4) :157-188
[3]   EPR OF A JAHN-TELLER DISTORTED (111) CARBON INTERSTITIALLY IN IRRADIATED SILICON [J].
BROWER, KL .
PHYSICAL REVIEW B, 1974, 9 (06) :2607-2617
[4]  
CORBETT JW, 1979, NASA C PUBL, V2097, P185
[5]  
Daly D. F., 1971, Radiation Effects, V8, P203, DOI 10.1080/00337577108231030
[6]   PHOTOCAPACITANCE STUDIES OF OXYGEN DONOR IN GAP .2. CAPTURE CROSS-SECTIONS [J].
HENRY, CH ;
KUKIMOTO, H ;
MILLER, GL ;
MERRITT, FR .
PHYSICAL REVIEW B, 1973, 7 (06) :2499-2507
[7]  
Kimerling L. C., 1979, International Conference on Defects and Radiation Effects in Semiconductors, P273
[8]  
KIMERLING LC, 1979, I PHYS C SER, V46, P56
[9]  
KIMERLING LC, 1977, I PHYS C SER, V31
[10]  
KIMERLING LC, 1976, RAD EFFECTS SEMICOND, P221